paper_new submitted to World Scientific 4/6/00 : 22:47 1/1 LIMITATIONS ON THE RESOLUTION OF YAG:CE BEAM PROFILE MONITOR FOR HIGH BRIGHTNESS ELECTRON BEAM
نویسندگان
چکیده
The performance of single crystal YAG:Ce (Y3Al5O12 ) beam profile monitors was studied for transverse measurements on the high brightness ultrarelativistic electron beam at Accelerator Test Facility (ATF) at BNL. The test demonstrated systematic intensity dependent beam image enlargement on YAG monitors, compare to other diagnostics. Possible mechanisms of the effect have been studied. The quantitative examination was performed and compared to the developed phenomenological models. Limitations on the use of YAG:Ce diagnostics are discussed with respect to the high-brightness electron sources.
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